Polycrystalline Pb(Zr x Ti1 − x )O 3 thin films with various thicknesses were deposited at room temperature on MgO (100) substrates by pulsed laser deposition. X-ray diffraction and atomic force microscopy were used to characterize the crystal structure and morphology and spectrophotometry measurements at wavelengths from 180 nm to 3000 nm, and prism-coupler method were used in the optical characterization of the thin films. A thickness-temperature phase-diagram is presented. Phase co-existence was found to increase curvature and roughness of the films, causing broadening of guiding TE 0 modes, whereas in single phase oriented films FWHM Δ β mode values were smaller.
- Thin films
- phase co-existence
- optical properties
Puustinen, J., Lappalainen, J., Hiltunen, J., & Lantto, V. (2008). Variations of optical properties with phase co-existence in PZT thin films. Ferroelectrics, 370(1), 46-56. https://doi.org/10.1080/00150190802384336