Abstract
Polycrystalline Pb(Zr x Ti1 − x )O 3 thin films with various thicknesses were deposited at room temperature on MgO (100) substrates by pulsed laser deposition. X-ray diffraction and atomic force microscopy were used to characterize the crystal structure and morphology and spectrophotometry measurements at wavelengths from 180 nm to 3000 nm, and prism-coupler method were used in the optical characterization of the thin films. A thickness-temperature phase-diagram is presented. Phase co-existence was found to increase curvature and roughness of the films, causing broadening of guiding TE 0 modes, whereas in single phase oriented films FWHM Δ β mode values were smaller.
Original language | English |
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Pages (from-to) | 46-56 |
Number of pages | 11 |
Journal | Ferroelectrics |
Volume | 370 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2008 |
MoE publication type | A1 Journal article-refereed |
Keywords
- Thin films
- phase co-existence
- morphology
- optical properties