Variations of optical properties with phase co-existence in PZT thin films

Jarkko Puustinen, Jyrki Lappalainen, Jussi Hiltunen, Vilho Lantto

Research output: Contribution to journalArticleScientificpeer-review

9 Citations (Scopus)

Abstract

Polycrystalline Pb(Zr x Ti1 − x )O 3 thin films with various thicknesses were deposited at room temperature on MgO (100) substrates by pulsed laser deposition. X-ray diffraction and atomic force microscopy were used to characterize the crystal structure and morphology and spectrophotometry measurements at wavelengths from 180 nm to 3000 nm, and prism-coupler method were used in the optical characterization of the thin films. A thickness-temperature phase-diagram is presented. Phase co-existence was found to increase curvature and roughness of the films, causing broadening of guiding TE 0 modes, whereas in single phase oriented films FWHM Δ β mode values were smaller.
Original languageEnglish
Pages (from-to)46-56
Number of pages11
JournalFerroelectrics
Volume370
Issue number1
DOIs
Publication statusPublished - 2008
MoE publication typeA1 Journal article-refereed

Fingerprint

Optical properties
optical properties
Thin films
crystal morphology
Spectrophotometry
spectrophotometry
Pulsed laser deposition
thin films
Prisms
Full width at half maximum
couplers
prisms
pulsed laser deposition
Phase diagrams
Atomic force microscopy
roughness
Crystal structure
Surface roughness
curvature
phase diagrams

Keywords

  • Thin films
  • phase co-existence
  • morphology
  • optical properties

Cite this

Puustinen, Jarkko ; Lappalainen, Jyrki ; Hiltunen, Jussi ; Lantto, Vilho. / Variations of optical properties with phase co-existence in PZT thin films. In: Ferroelectrics. 2008 ; Vol. 370, No. 1. pp. 46-56.
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Variations of optical properties with phase co-existence in PZT thin films. / Puustinen, Jarkko; Lappalainen, Jyrki; Hiltunen, Jussi; Lantto, Vilho.

In: Ferroelectrics, Vol. 370, No. 1, 2008, p. 46-56.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Variations of optical properties with phase co-existence in PZT thin films

AU - Puustinen, Jarkko

AU - Lappalainen, Jyrki

AU - Hiltunen, Jussi

AU - Lantto, Vilho

PY - 2008

Y1 - 2008

N2 - Polycrystalline Pb(Zr x Ti1 − x )O 3 thin films with various thicknesses were deposited at room temperature on MgO (100) substrates by pulsed laser deposition. X-ray diffraction and atomic force microscopy were used to characterize the crystal structure and morphology and spectrophotometry measurements at wavelengths from 180 nm to 3000 nm, and prism-coupler method were used in the optical characterization of the thin films. A thickness-temperature phase-diagram is presented. Phase co-existence was found to increase curvature and roughness of the films, causing broadening of guiding TE 0 modes, whereas in single phase oriented films FWHM Δ β mode values were smaller.

AB - Polycrystalline Pb(Zr x Ti1 − x )O 3 thin films with various thicknesses were deposited at room temperature on MgO (100) substrates by pulsed laser deposition. X-ray diffraction and atomic force microscopy were used to characterize the crystal structure and morphology and spectrophotometry measurements at wavelengths from 180 nm to 3000 nm, and prism-coupler method were used in the optical characterization of the thin films. A thickness-temperature phase-diagram is presented. Phase co-existence was found to increase curvature and roughness of the films, causing broadening of guiding TE 0 modes, whereas in single phase oriented films FWHM Δ β mode values were smaller.

KW - Thin films

KW - phase co-existence

KW - morphology

KW - optical properties

U2 - 10.1080/00150190802384336

DO - 10.1080/00150190802384336

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VL - 370

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JO - Ferroelectrics

JF - Ferroelectrics

SN - 0015-0193

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