Variations of optical properties with phase co-existence in PZT thin films

Jarkko Puustinen, Jyrki Lappalainen, Jussi Hiltunen, Vilho Lantto

Research output: Contribution to journalArticleScientificpeer-review

9 Citations (Scopus)

Abstract

Polycrystalline Pb(Zr x Ti1 − x )O 3 thin films with various thicknesses were deposited at room temperature on MgO (100) substrates by pulsed laser deposition. X-ray diffraction and atomic force microscopy were used to characterize the crystal structure and morphology and spectrophotometry measurements at wavelengths from 180 nm to 3000 nm, and prism-coupler method were used in the optical characterization of the thin films. A thickness-temperature phase-diagram is presented. Phase co-existence was found to increase curvature and roughness of the films, causing broadening of guiding TE 0 modes, whereas in single phase oriented films FWHM Δ β mode values were smaller.
Original languageEnglish
Pages (from-to)46-56
Number of pages11
JournalFerroelectrics
Volume370
Issue number1
DOIs
Publication statusPublished - 2008
MoE publication typeA1 Journal article-refereed

Keywords

  • Thin films
  • phase co-existence
  • morphology
  • optical properties

Fingerprint Dive into the research topics of 'Variations of optical properties with phase co-existence in PZT thin films'. Together they form a unique fingerprint.

Cite this