Variations of optical properties with phase co-existence in PZT thin films

Jarkko Puustinen, Jyrki Lappalainen, Jussi Hiltunen, Vilho Lantto

    Research output: Contribution to journalArticleScientificpeer-review

    9 Citations (Scopus)

    Abstract

    Polycrystalline Pb(Zr x Ti1 − x )O 3 thin films with various thicknesses were deposited at room temperature on MgO (100) substrates by pulsed laser deposition. X-ray diffraction and atomic force microscopy were used to characterize the crystal structure and morphology and spectrophotometry measurements at wavelengths from 180 nm to 3000 nm, and prism-coupler method were used in the optical characterization of the thin films. A thickness-temperature phase-diagram is presented. Phase co-existence was found to increase curvature and roughness of the films, causing broadening of guiding TE 0 modes, whereas in single phase oriented films FWHM Δ β mode values were smaller.
    Original languageEnglish
    Pages (from-to)46-56
    Number of pages11
    JournalFerroelectrics
    Volume370
    Issue number1
    DOIs
    Publication statusPublished - 2008
    MoE publication typeA1 Journal article-refereed

    Keywords

    • Thin films
    • phase co-existence
    • morphology
    • optical properties

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