Verification of cryogenic on-wafer measurements for space applications

Anna Karvonen, Jussi Varis, Hannu Hakojärvi, Jussi Tuovinen

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

    Abstract

    In this paper, the accuracy issues of MilliLab's cryogenic on-wafer S-parameter and noise figure measurements techniques at V-band (50 - 75 GHz) frequencies are described. The accuracy of the system is dependent on the measurement error correction, also known as calibration. Calibration directly affects the measurement accuracy. The actual uncertainties of on-wafer cryogenic systems can only be estimated from the calibration quality and uncertainties calculated from the hardware configuration (test set, LO source, calibration method), usually on worst-case basis. Repeatability is easier to determine quantitatively than accuracy, and it is essential for demonstrating the reliability of the cryogenic measurement setup. Performing periodically several calibrations each followed by the actual measurements of the DUT was done in MilliLab to show the validity of the developed system. The results of the repeatability tests are presented here to describe the dependability of the cryogenic measurements at V-band.
    Original languageEnglish
    Title of host publication54th International Astronautical Congress
    PublisherAmerican Institute of Aeronautics and Astronautics (AIAA)
    Pages1375-1383
    ISBN (Print)978-1-61839-418-7, 1-61839-418-5
    DOIs
    Publication statusPublished - 2003
    MoE publication typeB3 Non-refereed article in conference proceedings
    Event54th International Astronautical Congress of the International Astronautical Federation, the International Academy of Astronautics, and the International Institute of Space Law - Bremen, Germany
    Duration: 29 Sep 20033 Oct 2003

    Conference

    Conference54th International Astronautical Congress of the International Astronautical Federation, the International Academy of Astronautics, and the International Institute of Space Law
    CountryGermany
    CityBremen
    Period29/09/033/10/03

    Keywords

    • noise temperature
    • cryogenic
    • accuracy
    • uncertainty
    • V-band
    • measurements
    • repeatability

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