Very wideband automated on-wafer noise figure and gain measurements at 50-110 GHz

Tauno Vähä-Heikkilä, Manu Lahdes, Mikko Kantanen, Timo Karttaavi, Jussi Tuovinen

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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    Engineering & Materials Science