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W-band on-wafer noise parameter measurements
Tauno Vähä-Heikkilä, Manu Lahdes, Jussi Varis, Mikko Kantanen, Jussi Tuovinen, Timo Karttaavi, Hannu Hakojärvi
Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review
1
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(Scopus)