W-band on-wafer noise parameter measurements

Tauno Vähä-Heikkilä, Manu Lahdes, Jussi Varis, Mikko Kantanen, Jussi Tuovinen, Timo Karttaavi, Hannu Hakojärvi

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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