Abstract
Reconfigurable integrated impedance tuners have been
developed for W-Band on-wafer noise parameter and
load-pull measurement applications. The impedance tuners
are based on double and triple-stub topologies and employ
11 switched MEMS capacitors producing 2048 (2¹¹)
different impedances. Measured |Gamma MAX| for the
double-stub tuner is 0.92 and 0.82 at 75 and 100 GHz from
110 measurements out of 2048 possible impedances, and
0.92 and 0.83 for the triple-stub tuner. To our
knowledge, this represents the first W-band integrated
impedance tuner to date.
Original language | English |
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Title of host publication | IEEE MTT-S International Microwave Symposium Digest 2005 |
Publisher | IEEE Institute of Electrical and Electronic Engineers |
Pages | 923-926 |
ISBN (Print) | 978-0-7803-8845-1 |
DOIs | |
Publication status | Published - 2005 |
MoE publication type | A4 Article in a conference publication |
Event | 2005 IEEE MTT-S International Microwave Symposium - Long Beach, United States Duration: 12 Jun 2005 → 17 Jun 2005 |
Conference
Conference | 2005 IEEE MTT-S International Microwave Symposium |
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Country/Territory | United States |
City | Long Beach |
Period | 12/06/05 → 17/06/05 |
Keywords
- RF MEMS
- impedance tuner
- matching network
- noise parameter
- load-pull
- on-wafer