Waveguide zeeman interferometry for thinfilm chemical sensors

K. Grace; K. Shrouf; Seppo Honkanen; Pekka Äyräs; Pekka Katila; Matti Leppihalme; R. Johnson; X. Yang; B. Swanson; Nasser Peyghambarian

doi:10.1049/el:19971108

Waveguide zeeman interferometry for thinfilm chemical sensors

K. Grace, K. Shrouf, Seppo Honkanen (Corresponding Author), Pekka Äyräs, Pekka Katila, Matti Leppihalme, R. Johnson, X. Yang, B. Swanson, Nasser Peyghambarian

VTT Technical Research Centre of Finland

Research output: Contribution to journal › Article › Scientific › peer-review

10 Citations (Scopus)

Abstract

The authors demonstrate a highly sensitive chemical sensor scheme based on Si/sub 3/N/sub 4/ channel waveguides, species-selective surface coatings and Zeeman interferometry. The relative phase change between the TE and TM modes under exposure to toluene vapour is measured. The measurements demonstrate the real-time and reversible response with good sensitivity at low concentrations.

Original language	English
Pages (from-to)	1651-1653
Journal	Electronics Letters
Volume	33
Issue number	19
DOIs	https://doi.org/10.1049/el:19971108
Publication status	Published - 1997
MoE publication type	A1 Journal article-refereed

Access to Document

10.1049/el:19971108

Cite this

@article{6360eaf9a82b467a97917c4f14447a74,

title = "Waveguide zeeman interferometry for thinfilm chemical sensors",

abstract = "The authors demonstrate a highly sensitive chemical sensor scheme based on Si/sub 3/N/sub 4/ channel waveguides, species-selective surface coatings and Zeeman interferometry. The relative phase change between the TE and TM modes under exposure to toluene vapour is measured. The measurements demonstrate the real-time and reversible response with good sensitivity at low concentrations.",

author = "K. Grace and K. Shrouf and Seppo Honkanen and Pekka {\"A}yr{\"a}s and Pekka Katila and Matti Leppihalme and R. Johnson and X. Yang and B. Swanson and Nasser Peyghambarian",

year = "1997",

doi = "10.1049/el:19971108",

language = "English",

volume = "33",

pages = "1651--1653",

journal = "Electronics Letters",

issn = "0013-5194",

publisher = "Institution of Engineering and Technology IET",

number = "19",

}

TY - JOUR

T1 - Waveguide zeeman interferometry for thinfilm chemical sensors

AU - Grace, K.

AU - Shrouf, K.

AU - Honkanen, Seppo

AU - Äyräs, Pekka

AU - Katila, Pekka

AU - Leppihalme, Matti

AU - Johnson, R.

AU - Yang, X.

AU - Swanson, B.

AU - Peyghambarian, Nasser

PY - 1997

Y1 - 1997

N2 - The authors demonstrate a highly sensitive chemical sensor scheme based on Si/sub 3/N/sub 4/ channel waveguides, species-selective surface coatings and Zeeman interferometry. The relative phase change between the TE and TM modes under exposure to toluene vapour is measured. The measurements demonstrate the real-time and reversible response with good sensitivity at low concentrations.

AB - The authors demonstrate a highly sensitive chemical sensor scheme based on Si/sub 3/N/sub 4/ channel waveguides, species-selective surface coatings and Zeeman interferometry. The relative phase change between the TE and TM modes under exposure to toluene vapour is measured. The measurements demonstrate the real-time and reversible response with good sensitivity at low concentrations.

U2 - 10.1049/el:19971108

DO - 10.1049/el:19971108

M3 - Article

SN - 0013-5194

VL - 33

SP - 1651

EP - 1653

JO - Electronics Letters

JF - Electronics Letters

IS - 19

ER -

Waveguide zeeman interferometry for thinfilm chemical sensors

Abstract

Access to Document

Fingerprint

Cite this