Waveguide zeeman interferometry for thinfilm chemical sensors

K. Grace, K. Shrouf, Seppo Honkanen (Corresponding Author), Pekka Äyräs, Pekka Katila, Matti Leppihalme, R. Johnson, X. Yang, B. Swanson, Nasser Peyghambarian

Research output: Contribution to journalArticleScientificpeer-review

10 Citations (Scopus)

Abstract

The authors demonstrate a highly sensitive chemical sensor scheme based on Si/sub 3/N/sub 4/ channel waveguides, species-selective surface coatings and Zeeman interferometry. The relative phase change between the TE and TM modes under exposure to toluene vapour is measured. The measurements demonstrate the real-time and reversible response with good sensitivity at low concentrations.
Original languageEnglish
Pages (from-to)1651-1653
JournalElectronics Letters
Volume33
Issue number19
DOIs
Publication statusPublished - 1997
MoE publication typeA1 Journal article-refereed

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  • Cite this

    Grace, K., Shrouf, K., Honkanen, S., Äyräs, P., Katila, P., Leppihalme, M., Johnson, R., Yang, X., Swanson, B., & Peyghambarian, N. (1997). Waveguide zeeman interferometry for thinfilm chemical sensors. Electronics Letters, 33(19), 1651-1653. https://doi.org/10.1049/el:19971108