Waveguide zeeman interferometry for thinfilm chemical sensors

K. Grace, K. Shrouf, Seppo Honkanen (Corresponding Author), Pekka Äyräs, Pekka Katila, Matti Leppihalme, R. Johnson, X. Yang, B. Swanson, Nasser Peyghambarian

Research output: Contribution to journalArticleScientificpeer-review

10 Citations (Scopus)

Abstract

The authors demonstrate a highly sensitive chemical sensor scheme based on Si/sub 3/N/sub 4/ channel waveguides, species-selective surface coatings and Zeeman interferometry. The relative phase change between the TE and TM modes under exposure to toluene vapour is measured. The measurements demonstrate the real-time and reversible response with good sensitivity at low concentrations.
Original languageEnglish
Pages (from-to)1651-1653
JournalElectronics Letters
Volume33
Issue number19
DOIs
Publication statusPublished - 1997
MoE publication typeA1 Journal article-refereed

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Chemical sensors
Interferometry
Toluene
Waveguides
Vapors
Coatings

Cite this

Grace, K., Shrouf, K., Honkanen, S., Äyräs, P., Katila, P., Leppihalme, M., ... Peyghambarian, N. (1997). Waveguide zeeman interferometry for thinfilm chemical sensors. Electronics Letters, 33(19), 1651-1653. https://doi.org/10.1049/el:19971108
Grace, K. ; Shrouf, K. ; Honkanen, Seppo ; Äyräs, Pekka ; Katila, Pekka ; Leppihalme, Matti ; Johnson, R. ; Yang, X. ; Swanson, B. ; Peyghambarian, Nasser. / Waveguide zeeman interferometry for thinfilm chemical sensors. In: Electronics Letters. 1997 ; Vol. 33, No. 19. pp. 1651-1653.
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Grace, K, Shrouf, K, Honkanen, S, Äyräs, P, Katila, P, Leppihalme, M, Johnson, R, Yang, X, Swanson, B & Peyghambarian, N 1997, 'Waveguide zeeman interferometry for thinfilm chemical sensors', Electronics Letters, vol. 33, no. 19, pp. 1651-1653. https://doi.org/10.1049/el:19971108

Waveguide zeeman interferometry for thinfilm chemical sensors. / Grace, K.; Shrouf, K.; Honkanen, Seppo (Corresponding Author); Äyräs, Pekka; Katila, Pekka; Leppihalme, Matti; Johnson, R.; Yang, X.; Swanson, B.; Peyghambarian, Nasser.

In: Electronics Letters, Vol. 33, No. 19, 1997, p. 1651-1653.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Waveguide zeeman interferometry for thinfilm chemical sensors

AU - Grace, K.

AU - Shrouf, K.

AU - Honkanen, Seppo

AU - Äyräs, Pekka

AU - Katila, Pekka

AU - Leppihalme, Matti

AU - Johnson, R.

AU - Yang, X.

AU - Swanson, B.

AU - Peyghambarian, Nasser

PY - 1997

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AB - The authors demonstrate a highly sensitive chemical sensor scheme based on Si/sub 3/N/sub 4/ channel waveguides, species-selective surface coatings and Zeeman interferometry. The relative phase change between the TE and TM modes under exposure to toluene vapour is measured. The measurements demonstrate the real-time and reversible response with good sensitivity at low concentrations.

U2 - 10.1049/el:19971108

DO - 10.1049/el:19971108

M3 - Article

VL - 33

SP - 1651

EP - 1653

JO - Electronics Letters

JF - Electronics Letters

SN - 0013-5194

IS - 19

ER -

Grace K, Shrouf K, Honkanen S, Äyräs P, Katila P, Leppihalme M et al. Waveguide zeeman interferometry for thinfilm chemical sensors. Electronics Letters. 1997;33(19):1651-1653. https://doi.org/10.1049/el:19971108