Waveguide zeeman interferometry for thinfilm chemical sensors

K. Grace; K. Shrouf; Seppo Honkanen; Pekka Äyräs; Pekka Katila; Matti Leppihalme; R. Johnson; X. Yang; B. Swanson; Nasser Peyghambarian

doi:10.1049/el:19971108

Waveguide zeeman interferometry for thinfilm chemical sensors

K. Grace, K. Shrouf, Seppo Honkanen^*, Pekka Äyräs, Pekka Katila, Matti Leppihalme, R. Johnson, X. Yang, B. Swanson, Nasser Peyghambarian

^*Corresponding author for this work

VTT Technical Research Centre of Finland

Research output: Contribution to journal › Article › Scientific › peer-review

10 Citations (Scopus)

Abstract

The authors demonstrate a highly sensitive chemical sensor scheme based on Si/sub 3/N/sub 4/ channel waveguides, species-selective surface coatings and Zeeman interferometry. The relative phase change between the TE and TM modes under exposure to toluene vapour is measured. The measurements demonstrate the real-time and reversible response with good sensitivity at low concentrations.

Original language	English
Pages (from-to)	1651-1653
Journal	Electronics Letters
Volume	33
Issue number	19
DOIs	https://doi.org/10.1049/el:19971108
Publication status	Published - 1997
MoE publication type	A1 Journal article-refereed

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10.1049/el:19971108

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title = "Waveguide zeeman interferometry for thinfilm chemical sensors",

abstract = "The authors demonstrate a highly sensitive chemical sensor scheme based on Si/sub 3/N/sub 4/ channel waveguides, species-selective surface coatings and Zeeman interferometry. The relative phase change between the TE and TM modes under exposure to toluene vapour is measured. The measurements demonstrate the real-time and reversible response with good sensitivity at low concentrations.",

author = "K. Grace and K. Shrouf and Seppo Honkanen and Pekka {\"A}yr{\"a}s and Pekka Katila and Matti Leppihalme and R. Johnson and X. Yang and B. Swanson and Nasser Peyghambarian",

year = "1997",

doi = "10.1049/el:19971108",

language = "English",

volume = "33",

pages = "1651--1653",

journal = "Electronics Letters",

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TY - JOUR

T1 - Waveguide zeeman interferometry for thinfilm chemical sensors

AU - Grace, K.

AU - Shrouf, K.

AU - Honkanen, Seppo

AU - Äyräs, Pekka

AU - Katila, Pekka

AU - Leppihalme, Matti

AU - Johnson, R.

AU - Yang, X.

AU - Swanson, B.

AU - Peyghambarian, Nasser

PY - 1997

Y1 - 1997

N2 - The authors demonstrate a highly sensitive chemical sensor scheme based on Si/sub 3/N/sub 4/ channel waveguides, species-selective surface coatings and Zeeman interferometry. The relative phase change between the TE and TM modes under exposure to toluene vapour is measured. The measurements demonstrate the real-time and reversible response with good sensitivity at low concentrations.

AB - The authors demonstrate a highly sensitive chemical sensor scheme based on Si/sub 3/N/sub 4/ channel waveguides, species-selective surface coatings and Zeeman interferometry. The relative phase change between the TE and TM modes under exposure to toluene vapour is measured. The measurements demonstrate the real-time and reversible response with good sensitivity at low concentrations.

U2 - 10.1049/el:19971108

DO - 10.1049/el:19971108

M3 - Article

SN - 0013-5194

VL - 33

SP - 1651

EP - 1653

JO - Electronics Letters

JF - Electronics Letters

IS - 19

ER -

Waveguide zeeman interferometry for thinfilm chemical sensors

Abstract

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