Wavelet excited measurement of system transfer function

H. Olkkonen, Juuso Olkkonen

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)

Abstract

This article introduces a new method, which is referred to as the wavelet excitation method (WEM), for the measurement of the system transfer function. Instead of commonly used impulse or sine wave excitations, the method uses a sequential excitation by biorthogonal symmetric wavelets.
The system transfer function is reconstructed from the output measurements. In the WEM the signals can be designed so that if N different excitation sequences are used and the excitation rate is f, the sampling rate of the analog-to-digital converter can be reduced to f∕N.
The WEM is especially advantageous in testing systems, where high quality impulse excitation cannot be applied. The WEM gave consistent results in transfer function measurements of various multistage amplifiers with the linear circuit analysis (SPICE) and the sine wave excitation methods.
The WEM makes available new high speed sensor applications, where the sampling rate of the sensor may be considerably lower compared with the system bandwidth.
Original languageEnglish
Article number025104
Number of pages5
JournalReview of Scientific Instruments
Volume78
Issue number2
DOIs
Publication statusPublished - 2007
MoE publication typeA1 Journal article-refereed

Fingerprint

transfer functions
Transfer functions
Sampling
excitation
Sensors
SPICE
Digital to analog conversion
Electric network analysis
sine waves
wave excitation
Bandwidth
impulses
Testing
sampling
linear circuits
sensors
analog to digital converters
amplifiers
high speed
bandwidth

Keywords

  • wavelets
  • wavelet transforms
  • analogue-digital conversion
  • amplifiers
  • linear network analysis
  • sensors
  • transfer functions

Cite this

Olkkonen, H. ; Olkkonen, Juuso. / Wavelet excited measurement of system transfer function. In: Review of Scientific Instruments. 2007 ; Vol. 78, No. 2.
@article{2ed3d205993448d28c18884c0faa1f1c,
title = "Wavelet excited measurement of system transfer function",
abstract = "This article introduces a new method, which is referred to as the wavelet excitation method (WEM), for the measurement of the system transfer function. Instead of commonly used impulse or sine wave excitations, the method uses a sequential excitation by biorthogonal symmetric wavelets. The system transfer function is reconstructed from the output measurements. In the WEM the signals can be designed so that if N different excitation sequences are used and the excitation rate is f, the sampling rate of the analog-to-digital converter can be reduced to f∕N. The WEM is especially advantageous in testing systems, where high quality impulse excitation cannot be applied. The WEM gave consistent results in transfer function measurements of various multistage amplifiers with the linear circuit analysis (SPICE) and the sine wave excitation methods. The WEM makes available new high speed sensor applications, where the sampling rate of the sensor may be considerably lower compared with the system bandwidth.",
keywords = "wavelets, wavelet transforms, analogue-digital conversion, amplifiers, linear network analysis, sensors, transfer functions",
author = "H. Olkkonen and Juuso Olkkonen",
year = "2007",
doi = "10.1063/1.2668680",
language = "English",
volume = "78",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics AIP",
number = "2",

}

Wavelet excited measurement of system transfer function. / Olkkonen, H.; Olkkonen, Juuso.

In: Review of Scientific Instruments, Vol. 78, No. 2, 025104 , 2007.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Wavelet excited measurement of system transfer function

AU - Olkkonen, H.

AU - Olkkonen, Juuso

PY - 2007

Y1 - 2007

N2 - This article introduces a new method, which is referred to as the wavelet excitation method (WEM), for the measurement of the system transfer function. Instead of commonly used impulse or sine wave excitations, the method uses a sequential excitation by biorthogonal symmetric wavelets. The system transfer function is reconstructed from the output measurements. In the WEM the signals can be designed so that if N different excitation sequences are used and the excitation rate is f, the sampling rate of the analog-to-digital converter can be reduced to f∕N. The WEM is especially advantageous in testing systems, where high quality impulse excitation cannot be applied. The WEM gave consistent results in transfer function measurements of various multistage amplifiers with the linear circuit analysis (SPICE) and the sine wave excitation methods. The WEM makes available new high speed sensor applications, where the sampling rate of the sensor may be considerably lower compared with the system bandwidth.

AB - This article introduces a new method, which is referred to as the wavelet excitation method (WEM), for the measurement of the system transfer function. Instead of commonly used impulse or sine wave excitations, the method uses a sequential excitation by biorthogonal symmetric wavelets. The system transfer function is reconstructed from the output measurements. In the WEM the signals can be designed so that if N different excitation sequences are used and the excitation rate is f, the sampling rate of the analog-to-digital converter can be reduced to f∕N. The WEM is especially advantageous in testing systems, where high quality impulse excitation cannot be applied. The WEM gave consistent results in transfer function measurements of various multistage amplifiers with the linear circuit analysis (SPICE) and the sine wave excitation methods. The WEM makes available new high speed sensor applications, where the sampling rate of the sensor may be considerably lower compared with the system bandwidth.

KW - wavelets

KW - wavelet transforms

KW - analogue-digital conversion

KW - amplifiers

KW - linear network analysis

KW - sensors

KW - transfer functions

U2 - 10.1063/1.2668680

DO - 10.1063/1.2668680

M3 - Article

VL - 78

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 2

M1 - 025104

ER -