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Wideband cryogenic on-wafer measurements at 20 - 295 K and 50-110 GHz
Tauno Vähä-Heikkilä (Corresponding author), Jussi Varis, Hannu Hakojärvi, Jussi Tuovinen
Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review
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(Scopus)