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Wideband cryogenic on-wafer measurements at 20 - 295 K and 50-110 GHz
- Tauno Vähä-Heikkilä*
- , Jussi Varis
- , Hannu Hakojärvi
- , Jussi Tuovinen
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review
1
Citation
(Scopus)