X-ray diffraction and Raman investigations of thickness dependent stress effects on Pb(ZrxTi1-x)O3 thin films

Jyrki Lappalainen, Vilho Lantto, Johannes Frantti, Jussi Hiltunen

    Research output: Contribution to journalArticleScientificpeer-review

    11 Citations (Scopus)


    Microstructure, film orientation, and optical transmission spectra of polycrystalline Nd-modified Pb(ZrxTi1−x)O3 films were studied as a function of film thickness. Pulsed laser deposition was used for the fabrication of films with thickness from 80to465nm on single-crystal MgO(100) substrates. Raman spectroscopy, x-ray diffraction, and spectrophotometry measurements were utilized in the film characterization. With the decreasing film thickness, films first oriented with c axis perpendicular to film surface, and then, after some critical thickness, changed to a-axis orientation. At the same time, compressive stress increased up to 1.3GPa and a clear blueshift of the optical absorption edge was found in transmission spectra.
    Original languageEnglish
    Article number252901
    JournalApplied Physics Letters
    Issue number25
    Publication statusPublished - 2006
    MoE publication typeA1 Journal article-refereed


    • lead
    • lead compounds
    • neodymium compounds
    • ferroelectric materials
    • ferroelectric thin films
    • thin films
    • Raman spectroscopy
    • x-ray diffraction
    • stress effects
    • internal stresses
    • spectral line shift


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