X-ray diffraction and Raman investigations of thickness dependent stress effects on Pb(ZrxTi1-x)O3 thin films

Jyrki Lappalainen, Vilho Lantto, Johannes Frantti, Jussi Hiltunen

Research output: Contribution to journalArticleScientificpeer-review

11 Citations (Scopus)

Abstract

Microstructure, film orientation, and optical transmission spectra of polycrystalline Nd-modified Pb(ZrxTi1−x)O3 films were studied as a function of film thickness. Pulsed laser deposition was used for the fabrication of films with thickness from 80to465nm on single-crystal MgO(100) substrates. Raman spectroscopy, x-ray diffraction, and spectrophotometry measurements were utilized in the film characterization. With the decreasing film thickness, films first oriented with c axis perpendicular to film surface, and then, after some critical thickness, changed to a-axis orientation. At the same time, compressive stress increased up to 1.3GPa and a clear blueshift of the optical absorption edge was found in transmission spectra.
Original languageEnglish
Article number252901
JournalApplied Physics Letters
Volume88
Issue number25
DOIs
Publication statusPublished - 2006
MoE publication typeA1 Journal article-refereed

Keywords

  • lead
  • lead compounds
  • neodymium compounds
  • ferroelectric materials
  • ferroelectric thin films
  • thin films
  • Raman spectroscopy
  • x-ray diffraction
  • stress effects
  • internal stresses
  • spectral line shift

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