X-ray diffraction and Raman investigations of thickness dependent stress effects on Pb(ZrxTi1-x)O3 thin films

Jyrki Lappalainen, Vilho Lantto, Johannes Frantti, Jussi Hiltunen

Research output: Contribution to journalArticleScientificpeer-review

11 Citations (Scopus)

Abstract

Microstructure, film orientation, and optical transmission spectra of polycrystalline Nd-modified Pb(ZrxTi1−x)O3 films were studied as a function of film thickness. Pulsed laser deposition was used for the fabrication of films with thickness from 80to465nm on single-crystal MgO(100) substrates. Raman spectroscopy, x-ray diffraction, and spectrophotometry measurements were utilized in the film characterization. With the decreasing film thickness, films first oriented with c axis perpendicular to film surface, and then, after some critical thickness, changed to a-axis orientation. At the same time, compressive stress increased up to 1.3GPa and a clear blueshift of the optical absorption edge was found in transmission spectra.
Original languageEnglish
Article number252901
JournalApplied Physics Letters
Volume88
Issue number25
DOIs
Publication statusPublished - 2006
MoE publication typeA1 Journal article-refereed

Fingerprint

thin films
diffraction
x rays
film thickness
spectrophotometry
pulsed laser deposition
optical absorption
x ray diffraction
Raman spectroscopy
microstructure
fabrication
single crystals

Keywords

  • lead
  • lead compounds
  • neodymium compounds
  • ferroelectric materials
  • ferroelectric thin films
  • thin films
  • Raman spectroscopy
  • x-ray diffraction
  • stress effects
  • internal stresses
  • spectral line shift

Cite this

@article{c3b15e1e3a08410c9ee7d0e800018576,
title = "X-ray diffraction and Raman investigations of thickness dependent stress effects on Pb(ZrxTi1-x)O3 thin films",
abstract = "Microstructure, film orientation, and optical transmission spectra of polycrystalline Nd-modified Pb(ZrxTi1−x)O3 films were studied as a function of film thickness. Pulsed laser deposition was used for the fabrication of films with thickness from 80to465nm on single-crystal MgO(100) substrates. Raman spectroscopy, x-ray diffraction, and spectrophotometry measurements were utilized in the film characterization. With the decreasing film thickness, films first oriented with c axis perpendicular to film surface, and then, after some critical thickness, changed to a-axis orientation. At the same time, compressive stress increased up to 1.3GPa and a clear blueshift of the optical absorption edge was found in transmission spectra.",
keywords = "lead, lead compounds, neodymium compounds, ferroelectric materials, ferroelectric thin films, thin films, Raman spectroscopy, x-ray diffraction, stress effects, internal stresses, spectral line shift",
author = "Jyrki Lappalainen and Vilho Lantto and Johannes Frantti and Jussi Hiltunen",
year = "2006",
doi = "10.1063/1.2216895",
language = "English",
volume = "88",
journal = "Applied Physics Letters",
issn = "0003-6951",
number = "25",

}

X-ray diffraction and Raman investigations of thickness dependent stress effects on Pb(ZrxTi1-x)O3 thin films. / Lappalainen, Jyrki; Lantto, Vilho; Frantti, Johannes; Hiltunen, Jussi.

In: Applied Physics Letters, Vol. 88, No. 25, 252901, 2006.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - X-ray diffraction and Raman investigations of thickness dependent stress effects on Pb(ZrxTi1-x)O3 thin films

AU - Lappalainen, Jyrki

AU - Lantto, Vilho

AU - Frantti, Johannes

AU - Hiltunen, Jussi

PY - 2006

Y1 - 2006

N2 - Microstructure, film orientation, and optical transmission spectra of polycrystalline Nd-modified Pb(ZrxTi1−x)O3 films were studied as a function of film thickness. Pulsed laser deposition was used for the fabrication of films with thickness from 80to465nm on single-crystal MgO(100) substrates. Raman spectroscopy, x-ray diffraction, and spectrophotometry measurements were utilized in the film characterization. With the decreasing film thickness, films first oriented with c axis perpendicular to film surface, and then, after some critical thickness, changed to a-axis orientation. At the same time, compressive stress increased up to 1.3GPa and a clear blueshift of the optical absorption edge was found in transmission spectra.

AB - Microstructure, film orientation, and optical transmission spectra of polycrystalline Nd-modified Pb(ZrxTi1−x)O3 films were studied as a function of film thickness. Pulsed laser deposition was used for the fabrication of films with thickness from 80to465nm on single-crystal MgO(100) substrates. Raman spectroscopy, x-ray diffraction, and spectrophotometry measurements were utilized in the film characterization. With the decreasing film thickness, films first oriented with c axis perpendicular to film surface, and then, after some critical thickness, changed to a-axis orientation. At the same time, compressive stress increased up to 1.3GPa and a clear blueshift of the optical absorption edge was found in transmission spectra.

KW - lead

KW - lead compounds

KW - neodymium compounds

KW - ferroelectric materials

KW - ferroelectric thin films

KW - thin films

KW - Raman spectroscopy

KW - x-ray diffraction

KW - stress effects

KW - internal stresses

KW - spectral line shift

U2 - 10.1063/1.2216895

DO - 10.1063/1.2216895

M3 - Article

VL - 88

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

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M1 - 252901

ER -