Abstract
Tungsten erosion, its subsequent transport and
redeposition are of great interest, because a full
tungsten divertor is foreseen to be used during the
deuterium-tritium operational phase of ITER. The erosion
of tungsten and carbon marker layers was extensively
studied in the outer divertor of ASDEX Upgrade (AUG), and
work is currently in progress to completely replace the
existing JET CFC tiles with tungsten-coated tiles within
the JET ITER-like wall project. The need for fast and
non-destructive method which allows the quantitative
determination of the thickness of a tungsten coating on a
carbon material on large areas led us to evaluate a
combined absorption/fluorescence X-ray (XRTF) technique.
The method can provide fast analysis, high spatial
resolution and a material selective detection of
deposited layers and inclusions. It was applied on W
coated fine grain graphite (FGG) tiles from AUG's
divertor. It is proved that the method is able to provide
information about the uniformity of the tungsten coating
on a graphite or CFC substrate whilst the technique can
be used to determine the thickness of the tungsten and
other marker materials coatings. It represents a unique
instrument for the post-mortem analysis of the coatings.
Original language | English |
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Pages (from-to) | S192-S197 |
Journal | Surface and Coatings Technology |
Volume | 205 |
Issue number | Suppl. 2 |
DOIs | |
Publication status | Published - 2011 |
MoE publication type | A1 Journal article-refereed |
Keywords
- Tungsten
- erosion
- X-ray fluorescence
- microtomography
- ASDEX
- JET