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• Focused Review on Print‐Patterned Contact Electrodes for Metal‐Oxide Thin‐Film Transistors

  Liu, F., Gillan, L., Leppäniemi, J. & Alastalo, A., 23 Jan 2023, (E-pub ahead of print) In: Advanced Materials Interfaces. 2202258.

  Research output: Contribution to journal › Review Article › peer-review

  Open Access

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• Frequency domain multiplexing readout for large arrays of transition-edge sensors

  Vaccaro, D., Akamatsu, H., Gottardi, L., van der Kuur, J., Nagayoshi, K., Taralli, E., de Wit, M., Bruijn, M. P., van der Linden, A. J., van Leeuwen, B. J., van der Hulst, P., Ravensberg, K., de Vries, C. P., Kiviranta, M., Gao, J. R. & den Herder, J. W. A., 11 Jan 2023, In: Nuclear Instruments and Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 1046, 167727.

  Research output: Contribution to journal › Article › Scientific › peer-review

  Open Access

• Generation and Structuring of Multipartite Entanglement in a Josephson Parametric System

  Petrovnin, K. V., Perelshtein, M. R., Korkalainen, T., Vesterinen, V., Lilja, I., Paraoanu, G. S. & Hakonen, P. J., 2023, In: Advanced Quantum Technologies. 6, 1, 19 p., 2200031.

  Research output: Contribution to journal › Article › Scientific › peer-review

  Open Access

• Active hyperspectral imager based on a supercontinuum laser and a MEMS Fabry-Pérot interferometer

  Kääriäinen, T. & Dönsberg, T., 23 Sep 2022, 2022 Conference on Lasers and Electro-Optics, CLEO 2022. IEEE Institute of Electrical and Electronic Engineers, 2 p. SF3F.5. (OSA Technical Digest). (Quantum Electronics and Laser Science).

  Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

• A device for shielding at least one component: Laite ainakin yhden komponentin suojelemiseksi

  Lehtinen, J., Mykkänen, E., Kemppinen, A., Ronzani, A. & Prunnila, M., 13 May 2022, IPC No. H05K 9/ 00 A N, Patent No. FI20215203, Priority date 23 Feb 2021, Priority No. FI20210005203

  Research output: Patent › Patent

• AI Machine Vision System for Wafer Defect Detection

  Morits, D., Rizzo Piton, M. & Laakko, T., Jun 2022, Industrial Artificial Intelligence Technologies and Applications. Vermesan, O., Wotawa, F., Nava, M. D. & Debaillie, B. (eds.). River Publishers, p. 73-80

  Research output: Chapter in Book/Report/Conference proceeding › Chapter or book article › Scientific › peer-review

  Open Access

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  15 Downloads (Pure)